"SRAM stability characterization using tunable ring oscillators in 45nm CMOS."

Jason Tsai et al. (2010)

Details and statistics

DOI: 10.1109/ISSCC.2010.5433820

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-27

a service of  Schloss Dagstuhl - Leibniz Center for Informatics