BibTeX record conf/isscc/SakanoTNAHYYKMI20

download as .bib file

@inproceedings{DBLP:conf/isscc/SakanoTNAHYYKMI20,
  author    = {Yorito Sakano and
               Takahiro Toyoshima and
               Ryosuke Nakamura and
               Tomohiko Asatsuma and
               Yuki Hattori and
               Takayuki Yamanaka and
               Ryoichi Yoshikawa and
               Naoki Kawazu and
               Tomohiro Matsuura and
               Takahiro Iinuma and
               Takahiro Toya and
               Tomohiko Watanabe and
               Atsushi Suzuki and
               Yuichi Motohashi and
               Junichiro Azami and
               Yasushi Tateshita and
               Tsutomu Haruta},
  title     = {5.7 {A} 132dB Single-Exposure-Dynamic-Range {CMOS} Image Sensor with
               High Temperature Tolerance},
  booktitle = {2020 {IEEE} International Solid- State Circuits Conference, {ISSCC}
               2020, San Francisco, CA, USA, February 16-20, 2020},
  pages     = {106--108},
  publisher = {{IEEE}},
  year      = {2020},
  url       = {https://doi.org/10.1109/ISSCC19947.2020.9063095},
  doi       = {10.1109/ISSCC19947.2020.9063095},
  timestamp = {Sat, 18 Apr 2020 17:42:06 +0200},
  biburl    = {https://dblp.org/rec/conf/isscc/SakanoTNAHYYKMI20.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics