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"A sub-electron readout noise CMOS image sensor with pixel-level open-loop ..."

Christian Lotto, Peter Seitz, Thomas Baechler (2011)

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DOI: 10.1109/ISSCC.2011.5746370

access: closed

type: Conference or Workshop Paper

metadata version: 2018-03-29

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Christian Lotto, Peter Seitz, Thomas Baechler:
A sub-electron readout noise CMOS image sensor with pixel-level open-loop voltage amplification. ISSCC 2011: 402-404

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