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"4.7 A 409GOPS/W adaptive and resilient domino register file in 22nm ..."

Jaydeep P. Kulkarni et al. (2015)

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DOI: 10.1109/ISSCC.2015.7062936

access: closed

type: Conference or Workshop Paper

metadata version: 2020-07-15

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Jaydeep P. Kulkarni, Carlos Tokunaga, Paolo A. Aseron, Trang Nguyen, Charles Augustine, James W. Tschanz, Vivek De:
4.7 A 409GOPS/W adaptive and resilient domino register file in 22nm tri-gate CMOS featuring in-situ timing margin and error detection for tolerance to within-die variation, voltage droop, temperature and aging. ISSCC 2015: 1-3

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