"Analysis and reliability test to improve the data retention performance of ..."

Jiyuan Luan, Michael DiVita (2013)

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DOI: 10.1109/ISQED.2013.6523622

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Jiyuan Luan, Michael DiVita:
Analysis and reliability test to improve the data retention performance of EPROM circuits. ISQED 2013: 273-277

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