"A novel two-dimensional scan-control scheme for test-cost reduction."

Chia-Yi Lin, Hung-Ming Chen (2010)

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DOI: 10.1109/ISQED.2010.5450439

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Chia-Yi Lin, Hung-Ming Chen:
A novel two-dimensional scan-control scheme for test-cost reduction. ISQED 2010: 237-243

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