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"Investigation of Process Impact on Soft Error Susceptibility of Nanometric ..."

Shah M. Jahinuzzaman, Mohammad Sharifkhani, Manoj Sachdev (2008)

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DOI: 10.1109/ISQED.2008.4479727

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - conf/isqed/JahinuzzamanSS08
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Shah M. Jahinuzzaman, Mohammad Sharifkhani, Manoj Sachdev:
Investigation of Process Impact on Soft Error Susceptibility of Nanometric SRAMs Using a Compact Critical Charge Model. ISQED 2008: 207-212

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