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"DVDT: Design for Voltage Drop Test Using Onchip-Voltage Scan Path."
Makoto Ikeda, Hideyuki Aoki, Kunihiro Asada (2000)
- Makoto Ikeda, Hideyuki Aoki, Kunihiro Asada:
DVDT: Design for Voltage Drop Test Using Onchip-Voltage Scan Path. ISQED 2000: 305-308
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