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"Improving the process variation tolerability of flip-flops for UDSM ..."

Eun Ju Hwang, Wook Kim, Young Hwan Kim (2010)

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DOI: 10.1109/ISQED.2010.5450488

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Eun Ju Hwang, Wook Kim, Young Hwan Kim:
Improving the process variation tolerability of flip-flops for UDSM circuit design. ISQED 2010: 812-817

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