"Dummy-Gate Structure to Improve ESD Robustness in a Fully-Salicided 130-nm ..."

Hsin-Chyh Hsu, Ming-Dou Ker (2006)

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DOI: 10.1109/ISQED.2006.54

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Hsin-Chyh Hsu, Ming-Dou Ker:
Dummy-Gate Structure to Improve ESD Robustness in a Fully-Salicided 130-nm CMOS Technology without Using Extra Salicide-Blocking Mask. ISQED 2006: 503-506

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