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"Automated Test Generation and Test Point Selection for Specification Test ..."

Achintya Halder, Abhijit Chatterjee (2004)

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DOI: 10.1109/ISQED.2004.1283707

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/isqed/HalderC04
Achintya Halder, Abhijit Chatterjee:
Automated Test Generation and Test Point Selection for Specification Test of Analog Circuits. ISQED 2004: 401-406

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