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"Design and Use of Memory-Specific Test Structures to Ensure SRAM Yield and ..."

F. Duan et al. (2003)

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DOI: 10.1109/ISQED.2003.1194719

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/isqed/DuanCVKR03
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  persistent URL:
  - https://dblp.org/rec/conf/isqed/DuanCVKR03
F. Duan, R. Castagnetti, R. Venkatraman, O. Kobozeva, S. Ramesh:
Design and Use of Memory-Specific Test Structures to Ensure SRAM Yield and Manufacturability. ISQED 2003: 119-124

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