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"Robust importance sampling for efficient SRAM yield analysis."

Takanori Date et al. (2010)

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DOI: 10.1109/ISQED.2010.5450410

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-17

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Takanori Date, Shiho Hagiwara, Kazuya Masu, Takashi Sato:
Robust importance sampling for efficient SRAM yield analysis. ISQED 2010: 15-21

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