BibTeX record conf/isqed/Aitken02

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@inproceedings{DBLP:conf/isqed/Aitken02,
  author       = {Robert C. Aitken},
  title        = {Test Generation and Fault Modeling for Stress Testing (invited)},
  booktitle    = {3rd International Symposium on Quality of Electronic Design, {ISQED}
                  2002, San Jose, CA, USA, March 18-21, 2002},
  pages        = {95--99},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/ISQED.2002.996704},
  doi          = {10.1109/ISQED.2002.996704},
  timestamp    = {Thu, 23 Mar 2023 23:58:32 +0100},
  biburl       = {https://dblp.org/rec/conf/isqed/Aitken02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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