"A Multi-Fault Dynamic Compaction Technique for Test Pattern Count Reduction."

Bo-Yi Li, Jiun-Lang Huang (2018)

Details and statistics

DOI: 10.1109/ISOCC.2018.8649901

access: closed

type: Conference or Workshop Paper

metadata version: 2019-03-05

a service of  Schloss Dagstuhl - Leibniz Center for Informatics