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"Endpoint Detection of SiO2 Plasma Etching Using Expanded Hidden ..."
Sung-Ik Jeon et al. (2010)
- Sung-Ik Jeon, Seung-Gyun Kim, Sang Jeen Hong, Seung Soo Han:
Endpoint Detection of SiO2 Plasma Etching Using Expanded Hidden Markov Model. ISNN (2) 2010: 464-471
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