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"PODEM Based on Static Testability Measures and Dynamic Testability ..."

Naotake Kamiura, Teijiro Isokawa, Nobuyuki Matsui (2002)

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DOI: 10.1109/ISMVL.2002.1011083

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/ismvl/KamiuraIM02
Naotake Kamiura, Teijiro Isokawa, Nobuyuki Matsui:
PODEM Based on Static Testability Measures and Dynamic Testability Measures for Multiple-Valued Logic Circuits. ISMVL 2002: 149-155

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