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"A probabilistic framework to estimate full-chips subthreshold leakage ..."

Songqing Zhang, Vineet Wason, Kaustav Banerjee (2004)

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DOI: 10.1145/1013235.1013278

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  - conf/islped/ZhangWB04
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Songqing Zhang, Vineet Wason, Kaustav Banerjee:
A probabilistic framework to estimate full-chips subthreshold leakage power distribution considering within-die and die-to-die P-T-V variations. ISLPED 2004: 156-161

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