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"An on-chip NBTI sensor for measuring PMOS threshold voltage degradation."

John Keane, Tony Tae-Hyoung Kim, Chris H. Kim (2007)

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DOI: 10.1145/1283780.1283821

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  dblp key:
  - conf/islped/KeaneKK07
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  persistent URL:
  - https://dblp.org/rec/conf/islped/KeaneKK07
John Keane, Tony Tae-Hyoung Kim, Chris H. Kim:
An on-chip NBTI sensor for measuring PMOS threshold voltage degradation. ISLPED 2007: 189-194

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