"ESD protection design for high-speed circuits in nanoscale CMOS process."

Chun-Yu Lin, Rong-Kun Chang (2016)

Details and statistics

DOI: 10.1109/ISICIR.2016.7829726

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-05

a service of  Schloss Dagstuhl - Leibniz Center for Informatics