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"A Formal Approach to Testing Logical Reliablity of Intelligent Device in ..."

Guoying Lin et al. (2018)

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DOI: 10.1109/ISGTEUROPE.2018.8571570

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-29

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  dblp key:
  - conf/isgteurope/LinPLJHL18
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  - https://dblp.org/rec/conf/isgteurope/LinPLJHL18
Guoying Lin, Feng Pan, Shi-xiang Lu, Kunqi Jia, Guangyu He, Yang Lin:
A Formal Approach to Testing Logical Reliablity of Intelligent Device in Home Energy Management System. ISGT Europe 2018: 1-6

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