"Temperature Sensitivity and Reliability Study of Symmetrical U-Shaped Gate ..."

Aadil Anam, S. Intekhab Amin, Dinesh Prasad (2023)

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DOI: 10.1109/ISES58672.2023.00030

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-02

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Aadil Anam, S. Intekhab Amin, Dinesh Prasad:
Temperature Sensitivity and Reliability Study of Symmetrical U-Shaped Gate Line TFET: RF/Analog and Linearity Performance Analysis. iSES 2023: 99-104

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