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"On the Repudiability of Device Identification and Image Integrity ..."

Chang-Tsun Li, Chih-Yuan Chang, Yue Li (2009)

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DOI: 10.1007/978-3-642-11530-1_3

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-29

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  persistent URL:
  - https://dblp.org/rec/conf/isdf/LiCL09
Chang-Tsun Li, Chih-Yuan Chang, Yue Li:
On the Repudiability of Device Identification and Image Integrity Verification Using Sensor Pattern Noise. ISDF 2009: 19-25

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