"Validation on Duality in Impact-ionization Carrier Generation at the Onset ..."

Takahiro Iizuka et al. (2019)

> Home

Details and statistics

DOI: 10.1109/ISDCS.2019.8719088

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/isdcs/IizukaHMM19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/isdcs/IizukaHMM19
Takahiro Iizuka, Hiroyuki Hashigami, Mitiko Miura-Mattausch, Hans Jürgen Mattausch:
Validation on Duality in Impact-ionization Carrier Generation at the Onset of Snapback in Power MOSFETs. ISDCS 2019: 1-4

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.