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"Characterization and modeling of reliability issues in nanoscale devices."

Gerhard Rzepa et al. (2015)

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DOI: 10.1109/ISCAS.2015.7169179

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-13

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  - conf/iscas/RzepaGKG15
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  - https://dblp.org/rec/conf/iscas/RzepaGKG15
Gerhard Rzepa, Wolfgang Goes, Ben Kaczer, Tibor Grasser:
Characterization and modeling of reliability issues in nanoscale devices. ISCAS 2015: 2445-2448

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