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"Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM."
Riaz Naseer et al. (2007)
- Riaz Naseer, Younes Boulghassoul, Jeff Draper, Sandeepan DasGupta, Art Witulski:
Critical Charge Characterization for Soft Error Rate Modeling in 90nm SRAM. ISCAS 2007: 1879-1882
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