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"ESD protection design for I/O cells in sub-130-nm CMOS technology with ..."

Kun-Hsien Lin, Ming-Dou Ker (2005)

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DOI: 10.1109/ISCAS.2005.1464805

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Kun-Hsien Lin, Ming-Dou Ker:
ESD protection design for I/O cells in sub-130-nm CMOS technology with embedded SCR structure. ISCAS (2) 2005: 1182-1185

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