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"Design-for-ESD-reliability for high-frequency I/O interface circuits in ..."

Jaesik Lee et al. (2001)

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DOI: 10.1109/ISCAS.2001.922345

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Jaesik Lee, Yoonjong Huh, Peter Bendix, Sung-Mo Kang:
Design-for-ESD-reliability for high-frequency I/O interface circuits in deep-submicron CMOS technology. ISCAS (4) 2001: 746-749

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