"Improved Read Access in GC-eDRAM Memory by Dual-Negative Word-Line Technique."

Roman Golman et al. (2020)

Details and statistics

DOI: 10.1109/ISCAS45731.2020.9180875

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-18

a service of  Schloss Dagstuhl - Leibniz Center for Informatics