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"A retiming-based test pattern generator design for built-in self test of ..."

Aiman H. El-Maleh, Yahya E. Osais (2001)

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DOI: 10.1109/ISCAS.2001.922296

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Aiman H. El-Maleh, Yahya E. Osais:
A retiming-based test pattern generator design for built-in self test of data path architectures. ISCAS (4) 2001: 550-553

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