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"On efficient extraction of partially specified test sets for synchronous ..."

Aiman H. El-Maleh, Khaled Al-Utaibi (2003)

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DOI: 10.1109/ISCAS.2003.1206346

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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  - conf/iscas/El-MalehA03
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Aiman H. El-Maleh, Khaled Al-Utaibi:
On efficient extraction of partially specified test sets for synchronous sequential circuits. ISCAS (5) 2003: 545-548

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