"An on-chip delay measurements module for nanostructures characterization."

Olivier Duval, Yvon Savaria (2004)

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type: Conference or Workshop Paper

metadata version: 2016-05-20

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Olivier Duval, Yvon Savaria:
An on-chip delay measurements module for nanostructures characterization. ISCAS (3) 2004: 721-724

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