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"A compact on-chip IR-drop measurement system in 28 nm CMOS technology."

Sebastian Dietel et al. (2014)

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DOI: 10.1109/ISCAS.2014.6865361

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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  - conf/iscas/DietelHEEHHSBF14
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  - https://dblp.org/rec/conf/iscas/DietelHEEHHSBF14
Sebastian Dietel, Sebastian Höppner, Holger Eisenreich, Georg Ellguth, Stefan Hänzsche, Stephan Henker, René Schüffny, Tim Brauninger, Ulrich Fiedler:
A compact on-chip IR-drop measurement system in 28 nm CMOS technology. ISCAS 2014: 1219-1222

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