"Modeling hot-electrons effects in silicon-on-sapphire MOSFETs."

Eugenio Culurciello, Andreas G. Andreou, Philippe O. Pouliquen (2002)

Details and statistics

DOI: 10.1109/ISCAS.2002.1009904

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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