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"Experimental analysis of buried SiGe pMOSFETs from the perspective of ..."

Felice Crupi et al. (2011)

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DOI: 10.1109/ISCAS.2011.5938049

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

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Felice Crupi, Massimo Alioto, Jacopo Franco, Paolo Magnone, Ben Kaczer, Guido Groeseneken, Jérôme Mitard, Liesbeth Witters, Thomas Y. Hoffmann:
Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scaling. ISCAS 2011: 2249-2252

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