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"A new methodology for the statistical analysis of VLSI CMOS circuits and ..."

Massimo Conti et al. (2002)

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DOI: 10.1109/ISCAS.2002.1010647

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-18

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Massimo Conti, Paolo Crippa, Simone Orcioni, Marcello Pesare, Claudio Turchetti, Loris Vendrame, Silvia Lucherini:
A new methodology for the statistical analysis of VLSI CMOS circuits and its application to flash memories. ISCAS (5) 2002: 89-92

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