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"A New Strategy for Test Pattern Generation in Sequential Circuits."

Beom-Ik Cheon, Walter Anheier, Rainer Laur (1994)

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DOI: 10.1109/ISCAS.1994.408759

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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  dblp key:
  - conf/iscas/CheonAL94
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  - https://dblp.org/rec/conf/iscas/CheonAL94
Beom-Ik Cheon, Walter Anheier, Rainer Laur:
A New Strategy for Test Pattern Generation in Sequential Circuits. ISCAS 1994: 77-80

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