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"A novel back-biasing low-leakage technique for FinFET forced stacks."

Davide Baccarin, David Esseni, Massimo Alioto (2011)

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DOI: 10.1109/ISCAS.2011.5938007

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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  - conf/iscas/BaccarinEA11
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  - https://dblp.org/rec/conf/iscas/BaccarinEA11
Davide Baccarin, David Esseni, Massimo Alioto:
A novel back-biasing low-leakage technique for FinFET forced stacks. ISCAS 2011: 2079-2082

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