"Comprehensive Reliability Analysis of 22nm FDSOI SRAM from Device Physics ..."

Om Prakash et al. (2023)

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DOI: 10.1109/ISCAS46773.2023.10182096

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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Om Prakash, Rodion Novkin, Virinchi Roy Surabhi, Prashanth Krishnamurthy, Ramesh Karri, Farshad Khorrami, Hussam Amrouch:
Comprehensive Reliability Analysis of 22nm FDSOI SRAM from Device Physics to Deep Learning. ISCAS 2023: 1-5

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