Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Multiple Bit Upsets in Register Circuits at the 5-nm Bulk FinFET Node."

Yoni Xiong et al. (2024)

> Home

Details and statistics

DOI: 10.1109/IRPS48228.2024.10529454

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/XiongPKBCB24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/XiongPKBCB24
Yoni Xiong, Nicholas J. Pieper, Jenna B. Kronenberg, Dennis R. Ball, Megan Casey, Bharat L. Bhuva:
Multiple Bit Upsets in Register Circuits at the 5-nm Bulk FinFET Node. IRPS 2024: 46

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.