"Customized Parallel Reliability Testing Platform with Multifold Throughput ..."

Peng Xiao et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405140

access: closed

type: Conference or Workshop Paper

metadata version: 2025-05-23

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Peng Xiao, Haris Hadziosmanovic, Michael Klessens, Rong Jiang, John Ortega, Daniel Schroeder, James Palmer, Ilan Tsameret:
Customized Parallel Reliability Testing Platform with Multifold Throughput Enhancement for Intel Stressing Tests. IRPS 2021: 1-6

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