"Trap Behaviors and Degradation Modeling in Positive Bias Temperature ..."

Liang Xiang et al. (2025)

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DOI: 10.1109/IRPS48204.2025.10983617

access: closed

type: Conference or Workshop Paper

metadata version: 2025-06-06

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Liang Xiang, Gangping Yan, Yunfei Shi, Hong Yang, Shangbo Yang, Gaobo Xu, Xiaolei Wang, Guilei Wang, Huaxiang Yin, Chao Zhao, Jun Luo, Wenwu Wang:
Trap Behaviors and Degradation Modeling in Positive Bias Temperature Instability of Back Gated IGZO Transistors. IRPS 2025: 1-5

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