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"Modeling of Charge Failure Mechanisms during the Short Term Retention ..."
Changbeom Woo et al. (2020)
- Changbeom Woo, Shinkeun Kim, Jaeyeol Park, Hyungcheol Shin, Haesoo Kim, Gil-Bok Choi, Moon-Sik Seo, Keum Hwan Noh:
Modeling of Charge Failure Mechanisms during the Short Term Retention Depending on Program/Erase Cycle Counts in 3-D NAND Flash Memories. IRPS 2020: 1-6
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