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"Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology."

Taiki Uemura et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405101

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-05

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  dblp key:
  - conf/irps/UemuraCJKLKLSRL21
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  - https://dblp.org/rec/conf/irps/UemuraCJKLKLSRL21
Taiki Uemura, Byungjin Chung, Jeongmin Jo, Mijoung Kim, Dalhee Lee, Gunrae Kim, Seungbae Lee, Taesjoong Song, Hwasung Rhee, Brandon Lee, Jaehee Choi:
Soft-Error Susceptibility in Flip-Flop in EUV 7 nm Bulk-FinFET Technology. IRPS 2021: 1-7

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