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"Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier ..."

Stanislav Tyaginov et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764515

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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  dblp key:
  - conf/irps/TyaginovMECBJVG22
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  - https://dblp.org/rec/conf/irps/TyaginovMECBJVG22
Stanislav Tyaginov, Alexander Makarov, Al-Moatasem Bellah El-Sayed, Adrian Vaisman Chasin, Erik Bury, Markus Jech, Michiel Vandemaele, Alexander Grill, An De Keersgieter, Mikhail I. Vexler, Geert Eneman, Ben Kaczer:
Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors. IRPS 2022: 6

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