Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Investigation of the Failure Mechanism of InGaAs-pHEMT under High ..."

Yasunori Tateno et al. (2021)

> Home

Details and statistics

DOI: 10.1109/IRPS46558.2021.9405166

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-05

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/TatenoNOMKOHIYN21
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/TatenoNOMKOHIYN21
Yasunori Tateno, Ken Nakata, Akio Oya, Keita Matsuda, Yoshihide Komatsu, Shinichi Osada, Masafumi Hirata, Shigeyuki Ishiyama, Toshiki Yoda, Atsushi Nitta, Tomio Sato:
Investigation of the Failure Mechanism of InGaAs-pHEMT under High Temperature Operating Life Tests. IRPS 2021: 1-4

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.