"Investigation of the Failure Mechanism of InGaAs-pHEMT under High ..."

Yasunori Tateno et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405166

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-05

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Yasunori Tateno, Ken Nakata, Akio Oya, Keita Matsuda, Yoshihide Komatsu, Shinichi Osada, Masafumi Hirata, Shigeyuki Ishiyama, Toshiki Yoda, Atsushi Nitta, Tomio Sato:
Investigation of the Failure Mechanism of InGaAs-pHEMT under High Temperature Operating Life Tests. IRPS 2021: 1-4

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