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"Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and ..."

Kazusa Takami et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10118134

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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  dblp key:
  - conf/irps/TakamiGALMMH23
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Kazusa Takami, Yuibi Gomi, Shin-ichiro Abe, Wang Liao, Seiya Manabe, Tetsuro Matsumoto, Masanori Hashimoto:
Characterizing SEU Cross Sections of 12- and 28-nm SRAMs for 6.0, 8.0, and 14.8 MeV Neutrons. IRPS 2023: 1-6

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