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"Assessing SiCr resistor drift for automotive analog ICs."
Kevin A. Stewart et al. (2021)
- Kevin A. Stewart, Keiichi Kimura, Matt Ring, Koen Noldus, Pat Hulse, Rick C. Jerome, Akihiro Hasegawa, Jeff P. Gambino, David T. Price:
Assessing SiCr resistor drift for automotive analog ICs. IRPS 2021: 1-4
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