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"A Novel Method for the Determination of Electromigration-Induced Void ..."

J. Shuster-Passage et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529368

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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  dblp key:
  - conf/irps/ShusterPassageRMHCGKCSKL24
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  persistent URL:
  - https://dblp.org/rec/conf/irps/ShusterPassageRMHCGKCSKL24
J. Shuster-Passage, S. Abdel Razek, M. Mattoo, Meike Hauschildt, Seungman Choi, Martin Gall, Armen Kteyan, Jun-Ho Choy, Valeriy Sukharev, Matthias Kraatz, J. R. Lloyd:
A Novel Method for the Determination of Electromigration-Induced Void Nucleation Stresses. IRPS 2024: 10

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