"Cascode GaN Power Transistor Robust for Single Event Burnout Caused by ..."

Ken Shono et al. (2025)

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DOI: 10.1109/IRPS48204.2025.10983763

access: closed

type: Conference or Workshop Paper

metadata version: 2025-06-04

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Ken Shono, Yoshiyuki Kotani, Ronald Barr, Likun Shen, Steven Wienecke:
Cascode GaN Power Transistor Robust for Single Event Burnout Caused by Neutron Irradiation. IRPS 2025: 1-4

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